Scientists observe a new type of topological defect in chiral magnets for the first time

In a new study, Nagoya University scientists used Lorentz transmission electron microscopy (LTEM) to visualize topological defects. They were able to do so by passing electrons and observing their deflections through a thin magnetic film. The topological defects were observed as contrasting pairs of bright and dark areas. Using this technique, the team imaged topological defects in a chiral magnetic thin film made of cobalt, zinc, and manganese.

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